• DocumentCode
    2473353
  • Title

    Fundamental study of "matrix pattern imaging", EB system

  • Author

    Tanimoto, S. ; Someda, Y. ; Okumura, M. ; Ohta, H. ; Sohda, Y. ; Saito, N.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    2000
  • fDate
    11-13 July 2000
  • Firstpage
    144
  • Lastpage
    145
  • Abstract
    A new approach of electron beam lithography is proposed for high-throughput exposure systems. In an exposure system using this approach, the electron sources are arranged in a matrix so that they produce an electron beam in the shape of a circuit pattern, which is focused on the target. We call our approach "matrix pattern imaging (MPI)". In such a system, the electron sources play a key role, and the MIM (metal-insulator-metal) cathode is a promising candidate for them. We therefore compared its properties to those of other candidates. We also performed simple projection experiments and evaluated the merits of such a system.
  • Keywords
    MIM devices; cathodes; electron beam lithography; electron sources; MIM cathode; electron beam lithography; electron source; matrix pattern imaging; projection exposure system; Cathodes; Circuits; Electrodes; Electron beams; Electron sources; Large scale integration; Lithography; Shape; Throughput; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2000 International
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-004-6
  • Type

    conf

  • DOI
    10.1109/IMNC.2000.872665
  • Filename
    872665