Title :
Low-current and high-reliability 80°C operation 650 nm-5 mW-LDs for DVD
Author :
Ohya, Masaki ; Fujii, Hiroaki ; Doi, Kenji ; Endo, Kenji
Author_Institution :
ULSI Device Dev. Labs., NEC Corp., Shiga, Japan
Abstract :
Low-current and high-reliability 80 C operation 650 nm 5 mW GaInP MQW laser diodes have been developed. The LDs are very attractive for use as light sources in advanced optical digital versatile disc applications
Keywords :
III-V semiconductors; gallium compounds; indium compounds; laser beam applications; laser reliability; laser transitions; optical disc storage; quantum well lasers; 5 mW; 650 nm; 80 C; DVD; GaInP MQW laser diodes; advanced optical digital versatile disc applications; high-reliability; light sources; low-current; Application software; Automobiles; DVD; Electrons; Microcomputers; Navigation; Optical modulation; Optical waveguides; Quantum well devices; Threshold current;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4947-4
DOI :
10.1109/LEOS.1998.739707
