The impact of guard trace with open stub on time-domain waveform in high-speed digital circuits

Author

Chiu, Po-Wei ; Shiue, Guang-Hwa

Author_Institution

Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan

fYear

2009

fDate

19-21 Oct. 2009

Firstpage

219

Lastpage

222

Abstract

Grounded guard traces are increasingly utilized to mitigate the crosstalk noise interference of the printed circuit board or package. This article discusses how the couple microstrip line inserted guard trace with stub affects the crosstalk noise. The guard trace with an open stub seriously degrades the performance of the coupled line with respect to signal integrity (SI) while far-end crosstalk noise will still occurs for stripline structure. Additionally, an analytical formula is proposed to approximate the extra crosstalk noise which is caused by guard trace stub.

Keywords

digital circuits; microstrip lines; printed circuits; analytical formula; couple microstrip line; crosstalk noise interference; grounded guard trace; guard trace stub; high-speed digital circuits; package; printed circuit board; signal integrity; stripline structure; time-domain waveform; Coupling circuits; Crosstalk; Degradation; Digital circuits; Interference; Microstrip; Packaging; Printed circuits; Stripline; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on

Conference_Location

Portland, OR

Print_ISBN

978-1-4244-4447-2

Electronic_ISBN

978-1-4244-5646-8

Type

conf

DOI

10.1109/EPEPS.2009.5338439

Filename

5338439