DocumentCode
2474049
Title
Pseudo-random behavioral ATPG
Author
Courbis, Anne-Lise ; Santucci, Jean-Francois
Author_Institution
LG12P, EMA-EERIE, Nimes, France
fYear
1995
fDate
16-18 Mar 1995
Firstpage
192
Lastpage
195
Abstract
This paper deals with a new approach for the Automatic Test Pattern Generation (ATPG) of circuits described from a behavioral point of view in VHDL. This approach is based on a pseudo-random process characterized by the fact that criteria for computing the test length and evaluating the quality of the generated data come from the field of software engineering. This paper presents the bases of this new approach in the field of hardware engineering and some experimental results
Keywords
automatic testing; fault diagnosis; hardware description languages; logic testing; VHDL; pseudo-random behavioral ATPG; Automatic test pattern generation; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Random number generation; Software engineering; Software testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 1995. Proceedings., Fifth Great Lakes Symposium on
Conference_Location
Buffalo, NY
ISSN
1066-1395
Print_ISBN
0-8186-7035-5
Type
conf
DOI
10.1109/GLSV.1995.516051
Filename
516051
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