Title :
A precise analytical eye-diagram estimation method for non-ideal high-speed channels
Author :
Cho, Jeonghyeon ; Song, Eakhwan ; Shim, Jongjoo ; Kim, Jiseong ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
In this paper, we propose an analytical eye-diagram estimation method for a channel of a pair of differential microstrip traces on PCBs with arbitrary source and load terminations. The closed-form equation of the voltage transfer function for the given channel structure is derived and the method to deduce the worst case data patterns by considering the asymmetric and finite slew rates of the input signals is introduced. The validity of the proposed method was verified through comparison with the DDJ and eye-opening voltage values obtained by using HSPICE simulations.
Keywords :
SPICE; printed circuits; HSPICE simulations; PCB; analytical eye-diagram estimation method; channel structure; closed-form equation; differential microstrip traces; eye-opening voltage values; finite slew; load terminations; nonideal high-speed channels; voltage transfer function; Equations; Frequency; Impedance; Laboratories; Microstrip; Packaging; Propagation losses; Reflection; Transfer functions; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4447-2
Electronic_ISBN :
978-1-4244-5646-8
DOI :
10.1109/EPEPS.2009.5338452
