Title :
A Markov random field model-based approach to image interpretation
Author :
Modestino, J.W. ; Zhang, J.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, New York, NY, USA
Abstract :
A Markov random field (MRF) model-based approach to automated image interpretation is described and demonstrated as a region-based scheme. In this approach, an image is first segmented into a collection of disjoint regions which form the nodes of an adjacency graph. Image interpretation is then achieved through assigning object labels, or interpretations, to the segmented regions, or nodes, using domain knowledge, extracted feature measurements, and spatial relationships between the various regions. The interpretation labels are modeled as a MRF on the corresponding adjacency graph, and the image interpretation problem are formulated as a maximum a posteriori estimation rule. Simulated annealing is used to find the best realization, or optimal interpretation. Through the MRF model, this approach also provides a systematic method for organizing and representing domain knowledge through the clique functions of the probability density function underlying MRF. Results of image interpretation experiments performed on synthetic and real-world images using this approach are described
Keywords :
Markov processes; graph theory; optimisation; pattern recognition; picture processing; Markov random field model-based approach; adjacency graph; domain knowledge; extracted feature measurements; image interpretation; maximum a posteriori estimation rule; optimisation; pattern recognition; picture processing; region-based scheme; segmentation; simulated annealing; spatial relationships; Biomedical measurements; Erbium; Feature extraction; Image edge detection; Image processing; Image segmentation; Integrated circuit modeling; Layout; Markov random fields; Systems engineering and theory;
Conference_Titel :
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-8186-1952-x
DOI :
10.1109/CVPR.1989.37888