Title :
A two-level optimization scheme for bandwidth optimization of a microprocessor vertical interconnect
Author :
Sathanur, Arun V. ; Jandhyala, Vikram ; Braunisch, Henning
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
A parametric model of a generic differential ten-layer microprocessor package line with two motherboard layers has been developed. A dimensionality reduction scheme and a reusable, multi-dimensional look-up table precede the global optimization phase which is facilitated by a smooth interpolation scheme based on splines. An accelerated boundary element based full-wave electromagnetic solver has been used to construct a look-up table of S-parameters for a number of designs. The second phase features a custom local optimizer incorporating all the variables without any dimension reduction. This methodology has been applied to automated synthesis of the differential package line resulting in a significant improvement of the return loss performance.
Keywords :
S-parameters; bandwidth allocation; boundary-elements methods; electronic engineering computing; electronics packaging; interpolation; microprocessor chips; splines (mathematics); table lookup; S-parameters look-up table; accelerated boundary element based fullwave electromagnetic solver; bandwidth optimization; custom local optimizer; differential ten layer microprocessor package line; dimensionality reduction scheme; microprocessor vertical interconnect; multidimensional look-up table; return loss performance improvement; reusable look-up table; smooth interpolation scheme; two motherboard layer; Acceleration; Bandwidth; Central Processing Unit; Frequency; Integrated circuit interconnections; LAN interconnection; Microprocessors; Multicore processing; Packaging; Table lookup;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4447-2
Electronic_ISBN :
978-1-4244-5646-8
DOI :
10.1109/EPEPS.2009.5338458