Direct observation technique of XLPE morphology through the FE-STEM method

Author

Ishida, Masayoshi ; Okamoto, Tatsuki

Author_Institution

Central Res. Inst. of Electric Power Ind., Nagasaki, Japan

fYear

1993

fDate

17-20 Oct 1993

Firstpage

757

Lastpage

762

Abstract

The direct observation of the microscopic morphology of cross-linked polyethylene (XLPE) insulations, performed by a field-emission transmission scanning electron microscope (FE-STEM), which combines a new field emission-type electron source and electron beam scanning. It has been found that the spherulite structures (subtle density difference) in unstained XLPE insulations can be observed in terms of the difference in contrast by means of the FE-STEM method. The density of spherulite structures in the XLPE insulation is higher than that of the regions between spherulites. These spherulite structures are dispersed and do not have clear borders

Keywords

XLPE insulation; electron field emission; insulation testing; polymer structure; scanning-transmission electron microscopy; FE-STEM method; XLPE morphology; cross-linked polyethylene; density difference; field-emission transmission scanning electron microscope; insulations; microscopic morphology; spherulite structures; unstained XLPE insulations; Acceleration; Atomic beams; Atomic measurements; Electron beams; Electron sources; Energy resolution; Iron; Morphology; Probes; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on

Conference_Location

Pocono Manor, PA

Print_ISBN

0-7803-0966-9

Type

conf

DOI

10.1109/CEIDP.1993.378882

Filename

378882