Title :
A point process approach for analyzing gait variability dynamics
Author :
Ellis, Robert J. ; Citi, Luca ; Barbieri, Riccardo
Author_Institution :
Med. Sch., Dept. of Neurology, Harvard Univ., Boston, MA, USA
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
We present a novel statistical paradigm for modeling and analysis of gait variability which captures the natural point process structure of gait intervals and allows for definition of new measures instantaneous mean and standard deviation. We validate our model using two existing data sets from physionet.org. Results show an excellent model fit and yield insights into the underlying statistical structure behind human gait. Statistical analyses further corroborate previous findings of increased variability in gait at different speeds, both self-paced and metronome-paced, and reveal a significant increase in gait variability in Parkinson´s subjects, as compared to young and elderly healthy subjects. These results indicate the validity of a point process approach to the analysis of gait, and the potential utility of incorporating instantaneous measures of gait into diagnostic or patient monitoring applications.
Keywords :
gait analysis; geriatrics; medical disorders; patient diagnosis; patient monitoring; statistical analysis; Parkinson´s disease; elderly healthy subjects; gait interval; gait variability dynamics; instantaneous mean; metronome-paced gait; natural point process structure; patient diagnostics; patient monitoring application; point process approach; self-paced gait; standard deviation; statistical paradigm; statistical structure; Analytical models; Correlation; Heart rate variability; Legged locomotion; Senior citizens; Strontium; Time measurement; Algorithms; Data Interpretation, Statistical; Diagnosis, Computer-Assisted; Gait; Gait Disorders, Neurologic; Humans; Parkinson Disease; Reproducibility of Results; Sensitivity and Specificity; Walking;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090475