• DocumentCode
    2474400
  • Title

    Initial oxidation of Si[001] induced by translational kinetic energy of O/sub 2/ supersonic molecula

  • Author

    Yoshigoe, A. ; Sano, M. ; Teraoka, Y.

  • Author_Institution
    Dept. of Synchrotron Radiat. Res., JAERI, Hyogo, Japan
  • fYear
    2000
  • fDate
    11-13 July 2000
  • Firstpage
    240
  • Lastpage
    241
  • Abstract
    The translational kinetic energy (Et) of O2, incident molecules can considerably affect the probability of dissociative adsorption and enhance surface chemical reactions. Supersonic molecular beams (SSMB ) is a fascinating method to control gas molecules with well-defined spatial distribution, particle flux and ( translational ) kinetic energies. The SSMB is also important technique for surface scientists to study adsorption energy barrier and sticking probabilities of incident particles on solid surfaqes. A great deal of experimental and theoretical work has been done to investigate kinetics and dynamics of O2, adsorption on Si(001) surface, however, little number of molecular beam work with greater than Et = 1.0eV of O2, on the initial oxidation of Si(001) has been published. We report the O2, sticking on Si(001) surface ( passive oxidation ) and the SiO desorption ( active oxidation ) induced by translational kinetic energies of O2, (up to 3.0 eV) using the SSMB.
  • Keywords
    adsorption; elemental semiconductors; molecule-surface impact; oxidation; oxygen; silicon; O/sub 2/; O/sub 2/ supersonic molecular beam; Si; adsorption energy barrier; dissociative adsorption; oxidation; sticking probability; surface chemical reaction; translational kinetic energy; Chemical analysis; Energy barrier; Kinetic energy; Oxidation; Reflectivity; Surface reconstruction; Surface treatment; Synchrotron radiation; Temperature; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2000 International
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-004-6
  • Type

    conf

  • DOI
    10.1109/IMNC.2000.872734
  • Filename
    872734