DocumentCode
2474506
Title
An intelligent learning model for stochastic data
Author
Bi Fan ; Geng Zhang ; Han-Xiong Li
Author_Institution
Dept. of Syst. Eng. & Eng. Manage., City Univ. of Hong Kong, Hong Kong, China
fYear
2012
fDate
14-17 Oct. 2012
Firstpage
2791
Lastpage
2795
Abstract
In the real world, uncertainty in the data is a frequently confronted difficulty problem for learning system. The performance of the learning method can be deteriorated by the uncertainty. To properly represent and handle the uncertainty problem becomes one of the key issues in the decision learning field. An intelligent learning model is presented in this paper to address the uncertainty problem. The noise-insensitive feature of the Naïve Bayesian classifier is used to enhance the noise-tolerant ability of probabilistic information based Support Vector Machine. The intelligent learning model conducts a flexible strategy to integrate the two models, based on the probabilistic decision information obtained from the two classifiers. Then, it gives the final decision. Furthermore, the intelligent learning model is evaluated on an artificial dataset for a classification task. The experiment results show good performance when compared with using only one technique in the noise environment.
Keywords
Bayes methods; decision theory; learning (artificial intelligence); pattern classification; stochastic processes; support vector machines; uncertainty handling; data uncertainty; decision learning field; flexible strategy; intelligent learning model; learning performance; naive Bayesian classifier; noise-insensitive feature; noise-tolerant ability enhance; probabilistic decision information; probabilistic information; stochastic data; support vector machine; uncertainty handlling; Bayesian methods; Learning systems; Mathematical model; Noise; Probabilistic logic; Support vector machines; Uncertainty; intelligent learning model; probabilistic integration; uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics (SMC), 2012 IEEE International Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4673-1713-9
Electronic_ISBN
978-1-4673-1712-2
Type
conf
DOI
10.1109/ICSMC.2012.6378171
Filename
6378171
Link To Document