Title :
Thermal treatment of polyethylene-2, 6-naphthalate (PEN) film and its influence on the morphology and dielectric strength
Author :
Cygan, P.J. ; Zheng, J.P. ; Yen, S.-P.S. ; Jow, T.R.
Author_Institution :
Army Res. Lab., Ft. Monmouth, NJ, USA
Abstract :
Polyethylene-2, 6-naphthalate (PEN) film can be modified through exposure to the temperatures exceeding its glass transition temperature (122°C) and crystallization temperature (185°C), where the biaxially oriented and semicrystalline structure of the film can undergo reorganization. Experiments were designed to characterize the effects of this type of treatment on the morphology and dielectric properties of the film. Several heat treatments, with some approaching the film´s melting temperature (265°C), were applied. Following the exposure, the dielectric properties of film samples were characterized and correlated to changes in the morphology. Increase in the breakdown strength was observed in samples where the percentage of crystallinity increased through thermal treatments. Increases from 8.5% for free standing samples to 15% for restrained samples were achieved
Keywords :
crystallisation; electric breakdown; glass transition; melting; permittivity; polyethylene insulation; polymer films; polymer structure; 122 degC; 185 degC; 265 degC; biaxially oriented; breakdown strength; crystallization temperature; dielectric strength; film; glass transition temperature; melting temperature; morphology; polyethylene-2, 6-naphthalate; semicrystalline structure; Breakdown voltage; Capacitors; Crystallization; Dielectric breakdown; Glass; Heat treatment; Morphology; Plastic films; Surface-mount technology; Temperature;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
DOI :
10.1109/CEIDP.1993.378902