DocumentCode
2474750
Title
Residual fields characterization with a virtual space charge model
Author
Franceschi, J.L. ; Petre, A. ; Boudou, L. ; Marty-Dessus, D.
Author_Institution
Lab. de Genie Electrique, Univ. Paul Sabatier, Toulouse, France
fYear
2002
fDate
2002
Firstpage
594
Lastpage
597
Abstract
The purpose of this work is to adopt a new procedure which consists in choosing a simple virtual charge distribution model. We have developed this model in association with an evolution of the LIMM method, called FLIMM (Focused Laser Intensity Modulation Method). The model has been applied to study the residual field after the application of an incident field to three polyethylene-based dielectrics samples. Analytical analysis shows that the pyroelectric current I(f) records a maximum IM at the frequency fM. This frequency varies with the sample thickness but the IM value is independent of this one. I. was estimated from the set of data measured with an incident beam on each side of the sample. With these two IM values one can calculate the space charge profile and then the corresponding residual internal field level. In LDPE materials the residual field is approximately 1 kV/mm, whereas for XLPE and LDPE with antioxidant samples it is four and ten times, respectively, more important. Therefore, it was estimated that in this case, the LDPE sample seems to be more insensitive to the aging process linked to space charge characteristics.
Keywords
photothermal effects; polyethylene insulation; pyroelectricity; space charge; FLIMM; LDPE; XLPE; focused laser intensity modulation method; polyethylene-based dielectrics; pyroelectric current; residual field; residual internal field level; sample thickness; space charge profile; virtual charge distribution model; Acoustic beams; Dielectrics; Electrodes; Frequency; Intensity modulation; Laser modes; Optical materials; Pyroelectricity; Space charge; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN
0-7803-7502-5
Type
conf
DOI
10.1109/CEIDP.2002.1048866
Filename
1048866
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