• DocumentCode
    2474750
  • Title

    Residual fields characterization with a virtual space charge model

  • Author

    Franceschi, J.L. ; Petre, A. ; Boudou, L. ; Marty-Dessus, D.

  • Author_Institution
    Lab. de Genie Electrique, Univ. Paul Sabatier, Toulouse, France
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    594
  • Lastpage
    597
  • Abstract
    The purpose of this work is to adopt a new procedure which consists in choosing a simple virtual charge distribution model. We have developed this model in association with an evolution of the LIMM method, called FLIMM (Focused Laser Intensity Modulation Method). The model has been applied to study the residual field after the application of an incident field to three polyethylene-based dielectrics samples. Analytical analysis shows that the pyroelectric current I(f) records a maximum IM at the frequency fM. This frequency varies with the sample thickness but the IM value is independent of this one. I. was estimated from the set of data measured with an incident beam on each side of the sample. With these two IM values one can calculate the space charge profile and then the corresponding residual internal field level. In LDPE materials the residual field is approximately 1 kV/mm, whereas for XLPE and LDPE with antioxidant samples it is four and ten times, respectively, more important. Therefore, it was estimated that in this case, the LDPE sample seems to be more insensitive to the aging process linked to space charge characteristics.
  • Keywords
    photothermal effects; polyethylene insulation; pyroelectricity; space charge; FLIMM; LDPE; XLPE; focused laser intensity modulation method; polyethylene-based dielectrics; pyroelectric current; residual field; residual internal field level; sample thickness; space charge profile; virtual charge distribution model; Acoustic beams; Dielectrics; Electrodes; Frequency; Intensity modulation; Laser modes; Optical materials; Pyroelectricity; Space charge; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
  • Print_ISBN
    0-7803-7502-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2002.1048866
  • Filename
    1048866