DocumentCode :
247477
Title :
Electromagnetic sensitivity analysis of RF gas micro/nano-breakdown
Author :
Semnani, Abbas ; Peroulis, Dimitrios
Author_Institution :
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
1602
Lastpage :
1603
Abstract :
RF gas micro-breakdown occurs in the presence of electric field in the order of 10s of V/μm. In addition to gas type, pressure and temperature, the breakdown field also depends on several microscopic parameters such as the secondary electron emission coefficient and the field enhancement factor. In this paper, the effects of these parameters on the electromagnetic properties of micro-plasma regions in different RF discharge regimes are evaluated. It is shown that the breakdown voltage and the characteristics of the resulting plasma are almost independent of these parameters in the diffusion-controlled region while the situation is different in the boundary-controlled area.
Keywords :
electric breakdown; plasma properties; secondary electron emission; sensitivity analysis; RF gas micro/nano-breakdown; boundary-controlled area; breakdown field; breakdown voltage; diffusion-controlled region; electric field; electromagnetic properties; electromagnetic sensitivity analysis; field enhancement factor; microplasma regions; microscopic parameters; secondary electron emission coefficient; Cathodes; Discharges (electric); Ionization; Physics; Plasmas; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location :
Memphis, TN
ISSN :
1522-3965
Print_ISBN :
978-1-4799-3538-3
Type :
conf
DOI :
10.1109/APS.2014.6905127
Filename :
6905127
Link To Document :
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