• DocumentCode
    2474796
  • Title

    Effects of particles size of ATH fillers on the performance of RTV rubber coatings

  • Author

    Deng, H. ; Cherney, E.A. ; Hackam, R.

  • Author_Institution
    Dept. of Electr. Eng., Windsor Univ., Ont., Canada
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    598
  • Lastpage
    604
  • Abstract
    The authors present a study of the effects of the particle size of ATH (alumina trihydrate) on the performance of RTV (room-temperature vulcanizing) coatings on fiber glass rod insulators under contamination and wet conditions in a salt-fog chamber. Examination of the surface using attenuated total reflection Fourier transform infrared (FTIR) spectroscopy coupled with determination of the current pulse counts indicates a significant effect of the particle size on the performance of ATH-filled RTV coatings. The best performance leading to the lowest leakage current pulse counts and the longest time to failure was obtained with coatings having 4.5 and 13 μm sizes of ATH particles. Measurement of the IR spectra of silicone fluid diffused to the surface shows that the silicone fluid was more pronounced with these two particle sizes
  • Keywords
    Fourier transform spectra; aluminium compounds; infrared spectra; insulator testing; particle size; rubber; 13 micron; 4.5 micron; ATH fillers; ATR FTIR spectroscopy; AlH3; IR spectra; RTV rubber coatings; alumina trihydrate; contamination; fiber glass rod insulators; longest time to failure; lowest leakage current pulse counts; particle size; room-temperature vulcanizing; salt-fog chamber; silicone fluid; wet conditions; Coatings; Fourier transforms; Glass; Infrared spectra; Insulation; Leakage current; Particle measurements; Reflection; Spectroscopy; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378907
  • Filename
    378907