Title :
Phase noise measurement of free-running VCO using spectrum analyzer
Author :
Yuen, Chung Ming ; Tsang, Kim Fung
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, China
Abstract :
This work presents a cost-effective solution to measure the phase noise of a free-running microwave voltage controlled oscillator using a spectrum analyzer with add-on phase noise measurement software utility. To solve the frequency drift problem, the reference source is externally provided and tracked to the signal being tested. The system accepts random frequency drift up to +/-100 ppm. Measurement of the phase noise of a 2.5 GHz free-running voltage controlled oscillator is demonstrated. The result shows the accuracy, effectiveness and repeatability of the proposed method.
Keywords :
electric noise measurement; microwave oscillators; phase locked loops; phase measurement; phase noise; voltage-controlled oscillators; add-on phase software utility; free-running VCO; frequency drift problem; microwave voltage controlled oscillator; phase locked loops; phase noise measurement; spectrum analyzer; Counting circuits; Frequency conversion; Frequency measurement; Noise measurement; Phase detection; Phase frequency detector; Phase measurement; Phase noise; Spectral analysis; Voltage-controlled oscillators;
Conference_Titel :
Radio and Wireless Conference, 2004 IEEE
Print_ISBN :
0-7803-8451-2
DOI :
10.1109/RAWCON.2004.1389172
