• DocumentCode
    2474836
  • Title

    Clock jitter modeling in statistical link simulation

  • Author

    Oh, Dan ; Chang, Sam

  • Author_Institution
    Rambus Inc., Los Altos, CA, USA
  • fYear
    2009
  • fDate
    19-21 Oct. 2009
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    Statistical link analysis has gained significant importance as high-speed interconnect designs require accurate bit error rate prediction with device jitter and noise. Currently available statistical analysis techniques focus on modeling of data channels and the impact of a clock channel is often ignored or primitively approximated using a simple receiver sampling distribution. Thus, it ignores any jitter tracking between data and clock signals. In this paper, a general formulation is presented to model the common jitter source between data and clock signals in order to capture any jitter tracking between them. To demonstrate the usage of the proposed formulation, we have derived various models for commonly used clocking architectures, such as the forwarded clocking scheme in XDRtrade, DDR, and GDDR systems and the common source RefClk architecture used in PCIe channels. The formulation is verified numerically by using an internally developed CAD tool.
  • Keywords
    clocks; integrated circuit modelling; jitter; statistical analysis; GDDR systems; XDR systems; bit error rate prediction; clock channel; clock jitter modeling; clocking architecture; data channels; device jitter; forwarded clocking scheme; high-speed interconnect design; jitter tracking; simple receiver sampling distribution; statistical analysis; statistical link analysis; statistical link simulation; Analytical models; Bit error rate; Clocks; Crosstalk; Jitter; Predictive models; Sampling methods; Statistical analysis; Transmitters; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-4244-4447-2
  • Electronic_ISBN
    978-1-4244-5646-8
  • Type

    conf

  • DOI
    10.1109/EPEPS.2009.5338481
  • Filename
    5338481