Title :
0.18 µm BCD technology platform with best-in-class 6 V to 70 V power MOSFETs
Author :
Hsueh-Liang Chou ; Su, P.C. ; Ng, J.C.W. ; Wang, P.L. ; Lu, H.T. ; Lee, Chang Jae ; Syue, W.J. ; Yang, S.Y. ; Tseng, Y.C. ; Cheng, C.C. ; Yao, C.W. ; Liou, R.S. ; Jong, Y.C. ; Tsai, J.L. ; Jun Cai ; Tuan, H.C. ; Chih-Fang Huang ; Jeng Gong
Author_Institution :
Analog / RF & Specialty Technol. Div., TSMC, Hsinchu, Taiwan
Abstract :
This paper presents a single BCD technology platform with high performance power devices at a wide range of operating voltages. The platform offers 6 V to 70 V LDMOS devices. All devices offer best-in-class specific on-resistance of 20 to 40 % lower than that of the state-of-the-art IC-based LDMOS devices and robustness better than the square SOA (safe-operating-area). Fully isolated LDMOS devices, in which independent bias is capable for circuit flexibility, demonstrate superior specific on-resistance (e.g. 11.9 mΩ-mm2 for breakdown voltage of 39 V). Moreover, the unusual sudden current enhancement appeared in the ID-VD saturation region of most of the high voltage LDMOS devices is significantly suppressed.
Keywords :
power MOSFET; BCD technology platform; LDMOS device; current enhancement; high performance power device; power MOSFET; size 0.18 mum; voltage 6 V to 70 V; Breakdown voltage; Human computer interaction; Performance evaluation; Robustness; Semiconductor optical amplifiers; Substrates; USA Councils;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-1594-5
Electronic_ISBN :
1943-653X
DOI :
10.1109/ISPSD.2012.6229106