• DocumentCode
    2474937
  • Title

    Space charge formation in glass materials after electron-beam irradiation

  • Author

    Miyake, Hiroaki ; Tanaka, Yasuhiro ; Takada, Tatsuo ; Watanabe, Rikio ; Tomita, Nobuyuki

  • Author_Institution
    Electron. Meas. Lab., Musashi Inst. of Technol., Tokyo, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    631
  • Lastpage
    634
  • Abstract
    Charge distribution in various glass materials irradiated by electron beam was observed using PEA measurement system. Glass is used as a cover material for solar array panel of spacecraft. In space environment, the glass materials are sometimes charged up by irradiation of radioactive rays or plasma. The charging sometimes induced unexpected discharge accidents, which give serious damages to the spacecraft. Therefore, it is necessary to investigate the charge accumulation in glass materials irradiated by radioactive rays. In this experiment, we measured some kind of glasses with and without oxidized metal impurities. In the case of glass without impurity, almost no charge was observed after e-beam irradiation. On the other hand, negative or positive charge accumulations were observed in glass including oxidized metal impurities. The polarity of accumulated charge in samples irradiated by e-beam was related with the species of oxidized metal impurities.
  • Keywords
    electron beam effects; glass; space charge; PEA measurement system; cover material; electric discharge; electron beam irradiation; glass material; oxidized metal impurity; plasma charging; radioactive ray charging; solar array panel; space charge distribution; spacecraft; Aircraft manufacture; Charge measurement; Current measurement; Electron beams; Glass; Impurities; Plasma materials processing; Plasma measurements; Radioactive materials; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
  • Print_ISBN
    0-7803-7502-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2002.1048875
  • Filename
    1048875