Generation and compaction of mixed broadside and skewed-load n-detection test sets for transition faults

This paper describes an n-detection test generation strategy for mixed test sets, which consist of both broadside and skewed-load tests, targeting transition faults. The strategy consists of a test generation procedure without test compaction heuristics and a static test compaction procedure. The test generation procedure decides, every time a fault is targeted, whether to generate a broadside or a skewed-load test. The static test compaction procedure allows tests and test types to be modified in order to obtain more effective tests. Experimental results demonstrate the following. (1) The size of the test set produced by the test generation procedure grows slower than linearly with n. After static test compaction the increase in test set size with n is closer to the linear increase that is typical of compacted n-detection test sets. (2) For an individual fault, the n-detection test set may contain a mix of broadside and skewed-load tests to reach the target of n detections. (3) For the higher values of n, static test compaction typically improves the quality of the test set while reducing its size significantly.