Title :
Low-impedance power distribution network of decoupling capacitor embedded interposers for 3-D integrated LSI system
Author :
Kikuchi, Katsuya ; Takemura, Koichi ; Ueda, Chihiro ; Shimada, Osamu ; Gomyo, Toshio ; Takeuchi, Yukiharu ; Okubo, Toshikazu ; Baba, Kazuhiro ; Aoyagi, Masahiro ; Sudo, Toshio ; Otsuka, Kanji
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
Abstract :
We evaluated low-impedance power distribution network (PDN) of decoupling capacitor embedded interposers for 3-D integrated LSI system. Measurements are carried out using the developed impedance analyzer system of a wide frequency range for evaluating ultralow impedance, and calculations are carried out using 2.5-D finite element method (FEM) electromagnetic field simulator. We fabricated various types of capacitor mounted or capacitor embedded interposers test element group (TEG), such as surface-mounted and embedded chip capacitors, and thin film capacitors on silicon interposers using the same simple design to compare measurement results with calculation ones. As a result, the chip capacitor embedded organic interposer TEG and thin film capacitor embedded silicon interposer TEG could provide low PDN impedance at a wide frequency range of up to 10 GHz. In particular, the interposer TEGs of the thin film capacitor embedded interposer that shows a low impedance of approximately 0.001 Omega could be evaluated and calculated accurately. By using chip capacitor embedded or thin film capacitor embedded interposers for 3-D integrated LSI system, it is expected that the PDN of the system can be achieved ultralow PDN impedance.
Keywords :
distribution networks; finite element analysis; large scale integration; thin film capacitors; 3D integrated LSI system; decoupling capacitor embedded interposers; finite element method electromagnetic field simulator; low-impedance power distribution network; test element group; thin film capacitor; Capacitors; Electromagnetic measurements; Frequency; Impedance measurement; Large scale integration; Power systems; Semiconductor thin films; Silicon; Surface impedance; Transistors;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4447-2
Electronic_ISBN :
978-1-4244-5646-8
DOI :
10.1109/EPEPS.2009.5338487