DocumentCode :
2474972
Title :
A new approach to the electrical ageing problem in insulating polymers
Author :
Tu, D.M. ; Wang, X.S. ; Kao, K.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
fYear :
1993
fDate :
17-20 Oct 1993
Firstpage :
550
Lastpage :
555
Abstract :
According to Kao´s model of electric breakdown in insulators, charge carrier injection from electrical contacts and subsequent dissociative trapping and recombination play a decisive role in the breaking of polymer chains and the creation of free radicals or low-weight molecules and hence traps. The authors believe that electrical ageing is due to this gradual degradation process. On the basis of this concept coupled with the chemical decomposition process, they have derived a thoretical formula for the evaluation of the lifetime of insulating polymers under various electrical stressing conditions. They have also carried out an experimental study on polypropylene by measuring the changes in material density, radical and trap concentration, breakdown strength, and other properties as functions of applied electric field and stressing time. It is found that destructive breakdown occurs when the accumulation of field-induced radicals or traps reaches a certain critical level. Thus, the lifetime of an insulating polymer can be predicted by the time required for this critical level to be reached
Keywords :
ageing; carrier mobility; electric breakdown; organic insulating materials; polymer films; Kao´s model; breakdown strength; charge carrier injection; chemical decomposition process; dissociative trapping; electric breakdown; electrical ageing problem; free radicals; insulating polymers; low-weight molecules; polymer chains breaking; polypropylene; recombination; trap concentration; Aging; Charge carriers; Chemical processes; Contacts; Degradation; Density measurement; Dielectrics and electrical insulation; Electric breakdown; Plastic insulation; Polymers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
Type :
conf
DOI :
10.1109/CEIDP.1993.378915
Filename :
378915
Link To Document :
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