• DocumentCode
    2475039
  • Title

    Implications of high field conductivity in solid dielectrics

  • Author

    Boggs, S.A.

  • Author_Institution
    Dept. of Electr. Eng., Toronto Univ., Ont.
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    532
  • Lastpage
    537
  • Abstract
    In a discussion of high-field conductivity in solid dielectrics, the author inquires as to whether the limiting field is a strong function of the high field conduction model chosen and the model chosen causes substantial variations of other important parameters such as the power density in the high field region. The analysis is based on the AC conduction data of T. M. Tokoro et al. (1992), measured as a function of electric field and temperature. It is suggested that, if a defect-tolerant dielectric could be developed, it would be thermally stable for reasonable defects and power frequency application. Power dissipation and temperature rise do not appear to be strong functions of the model for σ(E) when σ(E)=ωε at the same fixed value of E. As a result, a defect-tolerant dielectric appears to be theoretically feasible
  • Keywords
    dielectric materials; electric breakdown; high field effects; thermal stability; defect-tolerant dielectric; high field conductivity; limiting field; power density; power dissipation; solid dielectrics; temperature rise; thermally stable; Conductivity; Current density; Dielectric measurements; Electrodes; IEL; Polymers; Solids; Space charge; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378918
  • Filename
    378918