DocumentCode
2475039
Title
Implications of high field conductivity in solid dielectrics
Author
Boggs, S.A.
Author_Institution
Dept. of Electr. Eng., Toronto Univ., Ont.
fYear
1993
fDate
17-20 Oct 1993
Firstpage
532
Lastpage
537
Abstract
In a discussion of high-field conductivity in solid dielectrics, the author inquires as to whether the limiting field is a strong function of the high field conduction model chosen and the model chosen causes substantial variations of other important parameters such as the power density in the high field region. The analysis is based on the AC conduction data of T. M. Tokoro et al. (1992), measured as a function of electric field and temperature. It is suggested that, if a defect-tolerant dielectric could be developed, it would be thermally stable for reasonable defects and power frequency application. Power dissipation and temperature rise do not appear to be strong functions of the model for σ(E) when σ(E)=ωε at the same fixed value of E. As a result, a defect-tolerant dielectric appears to be theoretically feasible
Keywords
dielectric materials; electric breakdown; high field effects; thermal stability; defect-tolerant dielectric; high field conductivity; limiting field; power density; power dissipation; solid dielectrics; temperature rise; thermally stable; Conductivity; Current density; Dielectric measurements; Electrodes; IEL; Polymers; Solids; Space charge; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location
Pocono Manor, PA
Print_ISBN
0-7803-0966-9
Type
conf
DOI
10.1109/CEIDP.1993.378918
Filename
378918
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