DocumentCode
2475227
Title
Transient pulse propagation using the Weibull distribution function
Author
Watkins, A. ; Tragoudas, Spyros
Author_Institution
Dept. of Electr. & Comput. Eng., Southern Illinois Univ. Carbondale, Carbondale, IL, USA
fYear
2012
fDate
3-5 Oct. 2012
Firstpage
109
Lastpage
114
Abstract
The proposed deterministic model aims to improve Soft Error Rate estimation by accurately approximating the generated pulse and all subsequent pulses. The generated pulse is approximated by a piecewise function consisting of two Weibull cumulative distribution functions. This method is an improvement over existing methods as it offers high accuracy while requiring less pre-characterization. This is accomplished by fitting a pulse to the Weibull function using actual gate parameters.
Keywords
Weibull distribution; deterministic algorithms; pulse circuits; radiation hardening (electronics); Weibull cumulative distribution functions; actual gate parameters; deterministic model; generated pulse; piecewise function; soft error rate estimation improvement; transient pulse propagation; Decision support systems; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location
Austin, TX
Print_ISBN
978-1-4673-3043-5
Type
conf
DOI
10.1109/DFT.2012.6378209
Filename
6378209
Link To Document