Built-in generation of multi-cycle broadside tests

This paper describes a built-in test generation method for multi-cycle broadside tests. A multicycle broadside test consists of a scan-in state and a sequence of primary input vectors. The method described in this paper uses pseudo-random scan-in states. The paper focuses on the generation of primary input sequences. A fixed set of primary input subsequences is implemented on-chip using a small number of small finite-state machines. Primary input configurations, which are implemented using multiplexers, determine primary input sequences for multicycle broadside tests by selecting a subsequence from the set for every primary input. Experimental results show that high transition fault coverage can be achieved even with pseudo-random scan-in states.