• DocumentCode
    2475380
  • Title

    High-sensitive measurement of surface charge distribution using spatial light phase modulator and image locking amplifier

  • Author

    Suzuki, S. ; Takayama, M. ; Hirata, Y. ; Kawasaki, T. ; Takada, T. ; Maeno, T.

  • Author_Institution
    Musashi Inst. of Technol., Tokyo, Japan
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    449
  • Lastpage
    454
  • Abstract
    By application of the electrooptic Pockels effect of the BSO (Bi 12SiO20) crystal, a measurement method for measuring the electrical surface charge distribution on an insulating film was developed. Using an image lock-in amplifier and a spatial optical phase modulator, the measurement system was improved with respect to sensitivity and resolution. With this improvement, the amount, polarity, and pattern of surface charges produced by an impulse surface discharge on insulating materials can be observed very clearly. The spatial resolution is enhanced from 750 μm to 200 μm, and the sensitivity is also enhanced. The typical surface charge distribution of a positive streamer generated by a high-voltage impulse (5 kV peak) is presented
  • Keywords
    Pockels effect; bismuth compounds; charge measurement; insulating thin films; surface charging; surface discharges; 200 micron; 5 kV; BSO; Bi12SiO20; electrooptic Pockels effect; high-voltage impulse; image lock-in amplifier; image locking amplifier; impulse surface discharge; insulating film; positive streamer; resolution; sensitivity; spatial light phase modulator; spatial optical phase modulator; spatial resolution; surface charge distribution; surface charges; Bismuth; Charge measurement; Current measurement; Dielectrics and electrical insulation; Electric variables measurement; Optical amplifiers; Optical films; Semiconductor optical amplifiers; Spatial resolution; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378931
  • Filename
    378931