DocumentCode :
2475417
Title :
Trap states limited nanosecond response of organic solar cells
Author :
Christ, Nico ; Kettlitz, Siegfried W. ; Züfle, Simon ; Valouch, Sebastian ; Lemmer, Uli
Author_Institution :
Light Technol. Inst. (LTI), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
fYear :
2010
fDate :
6-9 Sept. 2010
Firstpage :
69
Lastpage :
70
Abstract :
Measured transient current voltage characteristics of organic solar cells exhibit a tail in the decline characteristic which is proportional to t. Common numerical drift-diffusion simulations neglecting dispersive charge carrier transport fail to describe the observed long tail of the current density decline up to micro seconds. Our approach is to account for the observed dispersive charge carrier transport by introducing an exponential distribution of trap states into our simulation. These trap states represent the tail of a bimodal distribution of energy states, which is commonly used to describe the distribution of transport sites of the highest occupied / lowest unoccupied molecular orbital (HOMO/LUMO) in organic materials. By doing so, we can reproduce the measured characteristics over four decades in time. Results are qualitatively and quantitatively in excellent accordance for different laser intensities, different applied biases and different device diameters at the same time.
Keywords :
diffusion; numerical analysis; organic compounds; solar cells; bimodal distribution; charge carrier transport; current density; dispersive charge carrier transport; energy states; numerical drift-diffusion simulation; organic solar cells; transient current-voltage characteristics; trap states; Current density; Electron traps; Numerical models; Photovoltaic cells; Organic solar cell; P3HT:PCBM blend; nanosecond photoresponse; numerical simulation; optical modeling; organic photodetector; trap distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
Conference_Location :
Atlanta, GA
ISSN :
2158-3234
Print_ISBN :
978-1-4244-7016-7
Electronic_ISBN :
2158-3234
Type :
conf
DOI :
10.1109/NUSOD.2010.5595661
Filename :
5595661
Link To Document :
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