DocumentCode :
2475475
Title :
DC partial discharge detection and analysis techniques
Author :
Mathes, J.B. ; Whelan, T.J. ; Uhlrich, C.I.
Author_Institution :
Honeywell Fed. Manuf. & Technol., Albuquerque, NM, USA
fYear :
2002
fDate :
2002
Firstpage :
736
Lastpage :
739
Abstract :
This paper describes partial discharge (PD) detection systems being developed at Honeywell Federal Manufacturing & Technologies (FM&T) for use during in-process and final acceptance production-level DC hi-pot cable testing. The goal of this testing is to identify potential problems in cables during early stages of production as well as to assess insulation deterioration and aging in units removed from inventory for inspection. The test systems described employ partial discharge and leakage current detection circuits, high-resolution data acquisition systems, and data analysis and pulse characterizations algorithms. A novel low-noise amplification and detection circuit is presented along with data demonstrating a significant improvement in signal quality over earlier systems. Preliminary design concepts of research into the feasibility of using these data analysis techniques and finite element analysis (FEA) models to determine the nature of insulation defects based on the partial discharge signature are also presented.
Keywords :
cable testing; finite element analysis; insulation testing; leakage currents; partial discharge measurement; DC hi-pot cable testing; DC partial discharge detection systems; data analysis; finite element analysis; flat cables; high-resolution data acquisition systems; insulation aging; insulation deterioration; leakage current detection circuits; low-noise amplification-detection circuit; pulse characterization algorithms; round cables; Aging; Cable insulation; Circuit testing; Data analysis; Inspection; Insulation testing; Partial discharges; Production; Pulp manufacturing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
Type :
conf
DOI :
10.1109/CEIDP.2002.1048901
Filename :
1048901
Link To Document :
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