Title :
Optimal choice of arithmetic compactors for mixed-signal systems
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, ON, Canada
Abstract :
Compaction circuits that have been used for mixed-signal systems testing constitute a part of encoding/decoding device for an arithmetic error-control code (ECC). These circuits are commonly referred to as residue computing circuits (RCCs). As ECCs originated primarily to protect data transfers over binary channels, their design methodology has been mostly oriented towards a binary case. A non-binary design technique has only been considered for a special type of compaction modulus. In this work, we consider a design technique for a multiple-bit arithmetic compaction circuit with an arbitrary compaction modulus. It is assumed that the data being compacted are fuzzy. This in turn distorts the result of compaction increasing the aliasing rate. Even though the fault free system´s distortion is small, the compaction circuit may aggravate it beyond the acceptable levels making the method impractical. We design a low cost compactor that does not increase the distortion. The circuit can be used for off-line and on-line mixed-signal testing, as well as fault-tolerant data processing and noise-tolerant data transmission.
Keywords :
arithmetic codes; decoding; error correction codes; mixed analogue-digital integrated circuits; ECC; RCC; arbitrary compaction modulus; arithmetic error-control code; binary channels; data transfer protection; encoding-decoding device; fault-tolerant data processing; multiple-bit arithmetic compaction circuit; noise-tolerant data transmission; nonbinary design technique; offline mixed-signal testing; online mixed-signal testing; optimal choice; residue computing circuits; Adders; Circuit faults; Compaction; Fault tolerance; Fault tolerant systems; Testing; Very large scale integration; Data compaction and compression; analog-to-digital converter; built-in self-test; error control codes; signature analysis;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378221