DocumentCode
2475565
Title
Determination of wave noise sources using spectral parametric modeling
Author
Werling, T. ; Bourdel, E. ; Pasquet, D. ; Boudiaf, A.
Author_Institution
ENSEA-EMO, Cergy, France
Volume
3
fYear
1997
fDate
8-13 June 1997
Firstpage
1447
Abstract
We measure transistor noise power density and compute the Fourier´s transform. Finally, spectral parametric modeling is used to extract noise waves correlation matrix. Results obtained by this new method has been experimentally compared with a conventional method.
Keywords
Fourier transforms; correlation methods; electric noise measurement; semiconductor device noise; spectral analysis; transistors; Fourier transform; correlation matrix; spectral parametric model; transistor noise power density measurement; wave noise source; Autocorrelation; Circuit noise; Circuit testing; Density measurement; Fourier transforms; Noise measurement; Parametric statistics; Power amplifiers; Power measurement; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location
Denver, CO, USA
ISSN
0149-645X
Print_ISBN
0-7803-3814-6
Type
conf
DOI
10.1109/MWSYM.1997.596602
Filename
596602
Link To Document