• DocumentCode
    24756
  • Title

    An Improved Land-Surface Albedo Algorithm With DEM in Rugged Terrain

  • Author

    Jianguang Wen ; Xiaojie Zhao ; Qiang Liu ; Yong Tang ; Baocheng Dou

  • Author_Institution
    State Key Lab. of Remote Sensing Sci., Inst. of Remote Sensing & Digital Earth, Beijing, China
  • Volume
    11
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    883
  • Lastpage
    887
  • Abstract
    The influence of topography on land-surface bidirectional reflectance and albedo should be considered in rugged terrain. However, land-surface albedo algorithms neglect topographic effects, leading to errors in estimating the albedo in rugged terrain. This letter investigates the Angular Bin (AB) algorithm of land-surface albedo and shows that it should be improved when albedo is estimated in rugged terrain. The Terrain AB (TAB), an improved algorithm for albedo estimation with the AB algorithm and digital elevation model (DEM) data set, is presented in this letter. The accuracy and performance of the TAB algorithm was investigated by using the simulated DEM and Bidirectional Reflectance Function as well as the MODIS daily reflectance of the Heihe River Basin. The results show that the TAB algorithm has a better albedo estimation performance in rugged terrain and gives an acceptable accuracy.
  • Keywords
    albedo; digital elevation models; terrain mapping; topography (Earth); China; Heihe River Basin; MODIS daily reflectance; albedo estimation performance; angular bin algorithm; bidirectional reflectance function; digital elevation model data set; improved land-surface albedo algorithm; land-surface bidirectional reflectance; rugged terrain; simulated DEM; topographic effects; Accuracy; Estimation; Land surface; MODIS; Remote sensing; Surface topography; Angular Bin (AB) algorithm; Terrain AB (TAB) algorithm; land-surface albedo; rugged terrain; topographic effects;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2013.2280696
  • Filename
    6609033