DocumentCode :
2475661
Title :
Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG
Author :
Acevedo, Oscar ; Kagaris, Dimitri
Author_Institution :
ECE Dept., Southern Illinois Univ., Carbondale, IL, USA
fYear :
2012
fDate :
3-5 Oct. 2012
Firstpage :
233
Lastpage :
238
Abstract :
In built-in test pattern generation, a test cube is usually encoded or compressed by a seed vector that is used as the initial state of a Linear Feedback Shift Register (LFSR). The seed vector is found by solving a linear system of equations using a fixed (but arbitrarily chosen) characteristic polynomial for the LFSR In contrast, finding the LFSR characteristic polynomial to generate a given test cube provides more design freedom but results in a non-linear system of equations. In this paper, we address the latter problem using the Berlekamp-Massey (BM) algorithm. The BM algorithm is very efficient and obviates the need of solving a non-linear system, but it cannot work with don´t care values. We present therefore a procedure that assigns the don´t cares in a given test cube in such a way so as to minimize the resulting polynomial found by BM. Experimental results demonstrate the substantial improvement over a previous technique that assigns the don´t cares greedily.
Keywords :
automatic test pattern generation; built-in self test; logic testing; polynomials; shift registers; BM algorithm; Berlekamp-Massey algorithm; LFSR characteristic polynomials; TPG; built-in test pattern generation; fixed characteristic polynomial; linear equation system; linear feedback shift register; nonlinear equation system; seed vector; test cube; Decision support systems; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Tin; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
Type :
conf
DOI :
10.1109/DFT.2012.6378229
Filename :
6378229
Link To Document :
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