DocumentCode
2475662
Title
Metric Learning: A general dimension reduction framework for classification and visualization
Author
Lu, Chunyuan ; Feng, Guocan ; Jiang, Jianmin ; Wang, Patrick
Author_Institution
Sch. of Math. & Comput. Sci., Sun Yat-Sen Univ., China
fYear
2008
fDate
8-11 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
A new general dimension reduction framework based on similar and dissimilar metric learning is proposed in this paper which allows us to exploit the geometry of data to reduce the data dimension for classification and visualization. The general formulation can unify the existing dimension reduction algorithms within a common framework. Furthermore, this metric learning framework can be used as a general platform for developing new dimension reduction algorithms. By utilizing this framework as a tool, we propose a novel supervised dimension reduction algorithm named sub-manifold preserving analysis (SMPA) in which the intrinsic sub-manifold structure will be preserved while the margin of interclass will be separated. Experimental evidences show that performance of our proposed SMPA algorithm is better than other algorithms.
Keywords
data reduction; data visualisation; geometry; learning (artificial intelligence); pattern classification; data classification; data reduction; data visualization; dissimilar metric learning; geometry; similar metric learning; sub-manifold preserving analysis; supervised dimension reduction framework; Algorithm design and analysis; Data visualization; Embedded computing; Laplace equations; Linear discriminant analysis; Machine learning algorithms; Mathematics; Principal component analysis; Sun; Symmetric matrices;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location
Tampa, FL
ISSN
1051-4651
Print_ISBN
978-1-4244-2174-9
Electronic_ISBN
1051-4651
Type
conf
DOI
10.1109/ICPR.2008.4761130
Filename
4761130
Link To Document