Title :
Automated quality control for microtechnology components using a depth from focus approach
Author_Institution :
Inst. fur Theor. Nachrichtentech. und Inf., Hannover Univ., Germany
Abstract :
This paper describes an optical approach to verifying the geometric accuracy of object surfaces structured by an excimer laser. Due to the restricted space in the excimer laser system, a passive optical approach is chosen to be integrated in the system. Different optical techniques are compared. Their advantages and disadvantages for the use of integrating them in a laser system are discussed. The depth from focus approach is presented to create 3D models of surfaces structured by a laser and experimental results are shown. A proposal is given for implementing a runtime control loop for the laser system
Keywords :
image processing; laser beam machining; laser materials processing; micromachining; optical focusing; quality control; solid modelling; spatial variables measurement; 3D models; automated quality control; depth-from-focus approach; excimer laser; image stack; microtechnology components; object surface geometry; passive optical approach; Adaptive optics; Cameras; Geometrical optics; Laser modes; Monitoring; Optical interferometry; Optical microscopy; Optical pulses; Quality control; Surface emitting lasers;
Conference_Titel :
Image Analysis and Interpretation, 2002. Proceedings. Fifth IEEE Southwest Symposium on
Conference_Location :
Sante Fe, NM
Print_ISBN :
0-7695-1537-1
DOI :
10.1109/IAI.2002.999888