• DocumentCode
    2475964
  • Title

    Spectroscopic observations of light emission from surface flashover of insulators under high voltage stress

  • Author

    Sundararaman, R. ; Li, C.R. ; Goode, S.R. ; Sudarshan, T.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    293
  • Lastpage
    298
  • Abstract
    Spectroscopic investigations of the prebreakdown and breakdown luminescence of a dielectric surface under the application of a high-voltage pulse were performed in vacuum ambience on polycrystalline alumina. Information about the composition of the light emission was obtained with the aid of a 2D CCD (charge coupled device) camera interfaced with a flat field spectrometer. Time-resolved studies of the light emission were also done using two PMTs (photomultiplier) tubes with spectral response in the UV and visible region. The surface of the insulator was treated with different polishing media like silicon carbine discs and diamond paste in order to understand the role played by the surface microstructure of the sample. The results reported indicate that the surface treatment of a dielectric plays a very important role in the electrical performance of the insulator. In addition, it is evident that there are significant differences in the spectral nature of the light emission that can be observed from the spectrum of surface flashover from a SiC polished sample compared to that of an unpolished sample. A correlation between the electrical performance of the insulator and the development of the spectral nature of the light emission is indicated. All these interesting and important observations are being investigated in an extensive manner. The important role played by material defects and desorbed gases in the pre-breakdown phase of the surface flashover events are again confirmed
  • Keywords
    alumina; flashover; luminescence; silicon compounds; surface discharges; surface structure; surface treatment; time resolved spectra; Al2O3; SiC; UV region; breakdown luminescence; desorbed gases; dielectric surface; electrical performance; high voltage stress; high-voltage pulse; insulators; light emission; material defects; polishing; polycrystalline alumina; prebreakdown; spectral response; spectroscopic observations; surface flashover; surface microstructure; surface treatment; time resolved studies; vacuum ambience; visible region; Charge coupled devices; Charge-coupled image sensors; Dielectric breakdown; Dielectrics and electrical insulation; Electrochemical impedance spectroscopy; Flashover; Luminescence; Photomultipliers; Surface treatment; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378957
  • Filename
    378957