• DocumentCode
    2476050
  • Title

    High-speed nanoscale metal-semiconductor-metal photodetectors with terahertz bandwidth

  • Author

    Marks, Zefram ; Van Zeghbroeck, Bart

  • Author_Institution
    Univ. of Colorado at Boulder, Boulder, CO, USA
  • fYear
    2010
  • fDate
    6-9 Sept. 2010
  • Firstpage
    11
  • Lastpage
    12
  • Abstract
    A model for the maximum bandwidth achievable in metal-semiconductor-metal photodetectors is developed and simulated to determine the dimensions required for terahertz bandwidth. The bandwidth is found to exceed 1THz for devices with line pitch less than 100 nm.
  • Keywords
    high-speed optical techniques; metal-semiconductor-metal structures; microwave photonics; nanophotonics; photodetectors; semiconductor device models; high-speed nanoscale photodetectors; line pitch; metal-semiconductor-metal photodetectors; terahertz bandwidth; Bandwidth; Capacitance; Detectors; Integrated circuit modeling; Nanoscale devices; Photoconductivity; Photodetectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    2158-3234
  • Print_ISBN
    978-1-4244-7016-7
  • Electronic_ISBN
    2158-3234
  • Type

    conf

  • DOI
    10.1109/NUSOD.2010.5595692
  • Filename
    5595692