• DocumentCode
    2476065
  • Title

    Quantum dot photodiodes fabricated by electrostatic layer-by-layer self-assembly

  • Author

    Tu, Chang-Ching ; Lin, Lih Y.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
  • fYear
    2009
  • fDate
    17-20 Aug. 2009
  • Firstpage
    89
  • Lastpage
    90
  • Abstract
    In this paper we demonstrate photodiodes based on Schottky junction between multilayers of CdTe quantum dots (QDs) and thermally evaporated Au thin film. The CdTe QDs are synthesized and dispersed in aqueous solution with either positively (amino group) or negatively (carboxylate group) charged capping ligands. By electrostatic attraction, the QDs are self-assembled layer-by-layer on a silane functionalized substrate. By changing the number of layers, the thickness of the QD thin film can be well controlled. For the photodiode with 180 nm-thick CdTe QD thin film, external quantum efficiency = 1.38% can be achieved under 405 nm laser illumination and applied voltage = 10 V.
  • Keywords
    II-VI semiconductors; Schottky barriers; cadmium compounds; electrostatics; gold; metallic thin films; multilayers; nanotechnology; photodiodes; self-assembly; semiconductor thin films; CdTe-Au; Schottky junction; amino group; carboxylate group; electrostatic attraction; electrostatic layer-by-layer self-assembly; external quantum efficiency; multilayers; negatively charged capping ligands; photodiodes; positively charged capping ligands; quantum dots; size 180 nm; thin film; voltage 10 V; wavelength 405 nm; Electrostatics; Gold; Nonhomogeneous media; Photodiodes; Quantum dots; Quantum well lasers; Self-assembly; Substrates; Thickness control; Transistors; Schottky junction; layer-by-layer self-assembly; photodiodes; quantum dots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics, 2009 IEEE/LEOS International Conference on
  • Conference_Location
    Clearwater, FL
  • Print_ISBN
    978-1-4244-2382-8
  • Electronic_ISBN
    978-1-4244-2382-8
  • Type

    conf

  • DOI
    10.1109/OMEMS.2009.5338581
  • Filename
    5338581