DocumentCode
2476186
Title
Reliability Studies of Mesa Transistors
Author
Aubin, Frank
fYear
1962
fDate
1962
Firstpage
215
Lastpage
221
Keywords
Circuit synthesis; Circuit testing; Electric shock; Instruments; Laboratories; Life testing; Reliability; System testing; Thermal stresses; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
1962 IRE National Convention
Type
conf
DOI
10.1109/IRENC.1962.199243
Filename
1536183
Link To Document