Title :
High frequency characterization of the semi-conducting screens of medium voltage XLPE cables
Author :
Mugala, G. ; Eriksson, R. ; Gäfvert, U.
Author_Institution :
R. Inst. of Technol., Stockholm, Sweden
Abstract :
In this study, a high frequency measurement technique to characterize the semi-conducting materials of the medium voltage XLPE cables in the frequency range of 30 kHz to 500 MHz has been developed. The influence of the experimental set-up and the sample preparation methods are investigated. A dielectric response model is then developed for the semiconducting materials and this is incorporated into a model for the whole cable. The propagation characteristics obtained from the cable model are then compared with those obtained from measurements carried out on the actual XLPE cables.
Keywords :
high-frequency effects; power cables; semiconductor materials; 30 kHz to 500 MHz; dielectric response model; experimental set-up influence; high frequency characterization; medium voltage XLPE cables; propagation characteristics; sample preparation method influence; semiconducting screens; Admittance; Cables; Conducting materials; Dielectric measurements; Frequency measurement; Impedance; Inductance; Insulation; Medium voltage; Permittivity measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
DOI :
10.1109/CEIDP.2002.1048937
