Title :
The investigation of charging on α-quartz facets by a SEM technique
Author :
Gong, H. ; Le Gressus, C. ; Oh, K.H. ; Ding, X.Z. ; Ong, C.K. ; Tan, B. T G
Author_Institution :
Dept. of Phys., Nat. Univ. of Singapore, Singapore
Abstract :
Electrons trapped on different cuts of α-quartz are determined. From an SEM (scanning electron microscope) mirror image for the charge potential. Different charging abilities for the various cuts are observed; charging ability decreases with increase of cutting angle. This phenomenon is related to polarization energy, defect density, and stresses
Keywords :
crystal defects; dielectric polarisation; piezoelectric materials; quartz; scanning electron microscopy; surface charging; α-quartz facets; SEM; SEM mirror image; SiO2; charge potential; charging; cutting angle; defect density; polarization energy; stresses; Acceleration; Current measurement; Electron traps; Insulation; Mirrors; Permittivity; Physics; Scanning electron microscopy; Stress; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
DOI :
10.1109/CEIDP.1993.378975
