Using voltage-driven model to correlate GTEM cell and anechoic chamber measurement

To improve the accuracy of the GTEM cell applied in radiated EMI measurement, an EMI noise extraction model and the error compensation method based on variance analysis are proposed. High moments were employed to compare the similarity of the two test curves between the GTEM cell after calibration and the standard test. The experimental results for a PCB using the voltage-driven model show that the accuracy of GTEM cell can be improved significantly and data are nearly consistent with the standard results using the suggested approach.