DocumentCode :
2476531
Title :
Electrical tree propagation along barrier-interfaces in epoxy resin
Author :
Vogelsang, R. ; Brütsch, R. ; Farr, T. ; Fröhlich, K.
Author_Institution :
High Voltage Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
fYear :
2002
fDate :
2002
Firstpage :
946
Lastpage :
950
Abstract :
The propagation of electrical trees along interfaces in epoxy resin is described. The electrical trees grew in needle-plane samples with and without internal barriers up to the final breakdown. The barrier materials glass, mica and PTFE had been chosen because they have significantly different bond mechanisms to the epoxy resin as well as being common materials in various composite high voltage insulation systems. The mechanical strength of the epoxy resin-barrier material systems was determined for the materials tested. The results show that the propagation of the tree along the barrier is dependent on the type of chemical bond and the shear strength between the epoxy resin and the barrier material. The higher the bond strength between the barrier and the epoxy the higher the resistance to electrical tree propagation. Furthermore it appears that the wettability of the barrier materials plays a minor role in tree propagation along them. The results give a better understanding of the failure mechanism of certain composite insulating materials exposed to high voltage.
Keywords :
bonds (chemical); composite insulating materials; composite material interfaces; epoxy insulation; filled polymers; shear strength; trees (electrical); wetting; PTFE barrier material; chemical bond; composite insulating materials; electrical tree propagation; epoxy resin-barrier interfaces; epoxy resin-barrier material systems; glass barrier material; high voltage failure mechanism; internal barriers; mechanical strength; mica barrier material; needle-plane samples; shear strength; wettability; Bonding; Chemicals; Composite materials; Electric breakdown; Epoxy resins; Glass; Materials testing; System testing; Trees - insulation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
Type :
conf
DOI :
10.1109/CEIDP.2002.1048953
Filename :
1048953
Link To Document :
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