• DocumentCode
    2476543
  • Title

    Ultra-low-power, radiation-hardened 12-bit analog-to-digital converter for space-based electro-optical sensors

  • Author

    Nystrom, Sven C. ; Smith, Todd R. ; Peterson, William R. ; LeFevre, David L. ; Butcher, Daryl T. ; Gipson, Larry ; Spanish, Martin M.

  • Author_Institution
    Raytheon Syst. Co., El Segundo, CA, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    31 Oct-7 Nov 1998
  • Abstract
    We have achieved a breakthrough in analog-to-digital converter (ADC) technology by demonstrating a robust, self-correcting 12-bit ADC ASIC architecture with about six times lower power dissipation than existing devices. The prototype ADC has noise and average differential nonlinearities so low that we believe it has the resolution required for 14 bits. The measured ADC power dissipation is 100 mW at 6 megasamples per second (MSPS)-six times lower than that of the best commercially available radiation-hardened ADC, which has only 11 effective bits of resolution. Four sample ADCs fabricated in a commercial, non-radiation-hardened process worked perfectly at total dose levels up to 50 krad(Si), a level sufficient for many space programs. The productized ADC is expected to be extremely radiation hardened: >300 krad(Si)
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; application specific integrated circuits; electro-optical devices; elemental semiconductors; radiation hardening (electronics); silicon; space vehicle electronics; 100 mW; 12-bit analog-to-digital converter; 300 krad; 50 krad; ADC ASIC architecture; Si; differential nonlinearities; electro-optical sensors; noise; power dissipation; self-correcting architecture; space programs; Analog-digital conversion; CMOS process; Capacitors; Circuits; Dynamic range; Power dissipation; Prototypes; Signal processing; Signal resolution; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital Avionics Systems Conference, 1998. Proceedings., 17th DASC. The AIAA/IEEE/SAE
  • Conference_Location
    Bellevue, WA
  • Print_ISBN
    0-7803-5086-3
  • Type

    conf

  • DOI
    10.1109/DASC.1998.739855
  • Filename
    739855