DocumentCode
2476591
Title
P1G-4 Characterization of Nanoimprinting Polymer Films Using Picosecond Ultrasonics
Author
Bryner, Juerg ; Vollmann, Jacqueline ; Aebi, Laurent ; Dual, Jurg ; Kehoe, Timothy ; Torres, Clivia Sotomayor
Author_Institution
ETH Zurich, Zurich
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
1409
Lastpage
1412
Abstract
laser acoustic setup is used to determine mechanical properties of polymer thin films which are used for nanoimprinting. Until now mechanical properties like the Young´s Modulus or the Poisson Ratio are not well known for these polymers in such small dimensions (100 - 600 nm thickness). The polymer films are spincoated on a silicon wafer and covered with a thin aluminum layer for a better energy absorption of the laser pulses. The measurements are performed on a femtosecond laser pump- probe setup with a collinear beam guidance. This measurement method is contact-free and non-destructive. Mechanical waves are excited and detected thermoelastically using infrared laser pulses of approximately 80 fs duration. The entire experimental setup is simulated numerically: The heat distribution and wave excitation in the thin films caused by the laser pulse, the wave propagation, and the photoacoustic detection. Results of the simulation are shown and a short overview of the simulation procedure is given. With the simulation it is possible to interpret and assign the various measured wave pulses. The laser acoustic measurements are compared with profilometry measurements performed on the same thin film structures in order to quantify the mechanical properties of the polymer films.
Keywords
high-speed optical techniques; laser beams; nanotechnology; photoacoustic effect; polymer films; thermoelasticity; ultrasonic materials testing; aluminum layer; collinear beam guidance; contact-free measurement; femtosecond laser pump-probe; heat distribution; infrared laser pulses; laser acoustics; mechanical properties; nanoimprinting; nondestructive measurement; photoacoustic detection; picosecond ultrasonics; polymer thin films; silicon wafer; size 100 nm to 600 nm; spin coating; thermoelastic detection; Acoustic measurements; Acoustic pulses; Infrared detectors; Laser excitation; Mechanical factors; Optical pulses; Performance evaluation; Polymer films; Pulse measurements; Pump lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.354
Filename
4409927
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