DocumentCode
2476744
Title
π-SIFT: A photometric and Scale Invariant Feature Transform
Author
Park, Jae-Han ; Park, Kyung-Wook ; Baeg, Seung-Ho ; Baeg, Moon-Hong
Author_Institution
Korea Inst. of Ind. Technol., South Korea
fYear
2008
fDate
8-11 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
For many years, various local descriptors that are insensitive to geometric changes such as viewpoint, rotation, and scale changes, have been attracting attention due to their promising performance. However, most existing local descriptors including the SIFT (Scale Invariant Feature Transform) are based on luminance information rather than color information thereby resulting in instability to photometric variations such as shadows, highlights, and illumination changes. In this paper, we propose a novel local descriptor, π-SIFT, that are invariant to both geometric and photometric variations. In order to achieve photometric invariance, we adopt photometric quasi-invariant features based on the dichromatic reflection model. The performance of the proposed descriptor is evaluated with SIFT.
Keywords
feature extraction; image colour analysis; photometry; π-SIFT; dichromatic reflection model; local descriptors; luminance information; photometric invariance; photometric variations; scale invariant feature transform; Brightness; Computer vision; Erbium; Filters; Light sources; Lighting; Optical reflection; Photometry; Power distribution; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location
Tampa, FL
ISSN
1051-4651
Print_ISBN
978-1-4244-2174-9
Electronic_ISBN
1051-4651
Type
conf
DOI
10.1109/ICPR.2008.4761181
Filename
4761181
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