• DocumentCode
    2476744
  • Title

    π-SIFT: A photometric and Scale Invariant Feature Transform

  • Author

    Park, Jae-Han ; Park, Kyung-Wook ; Baeg, Seung-Ho ; Baeg, Moon-Hong

  • Author_Institution
    Korea Inst. of Ind. Technol., South Korea
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    For many years, various local descriptors that are insensitive to geometric changes such as viewpoint, rotation, and scale changes, have been attracting attention due to their promising performance. However, most existing local descriptors including the SIFT (Scale Invariant Feature Transform) are based on luminance information rather than color information thereby resulting in instability to photometric variations such as shadows, highlights, and illumination changes. In this paper, we propose a novel local descriptor, π-SIFT, that are invariant to both geometric and photometric variations. In order to achieve photometric invariance, we adopt photometric quasi-invariant features based on the dichromatic reflection model. The performance of the proposed descriptor is evaluated with SIFT.
  • Keywords
    feature extraction; image colour analysis; photometry; π-SIFT; dichromatic reflection model; local descriptors; luminance information; photometric invariance; photometric variations; scale invariant feature transform; Brightness; Computer vision; Erbium; Filters; Light sources; Lighting; Optical reflection; Photometry; Power distribution; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-2174-9
  • Electronic_ISBN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2008.4761181
  • Filename
    4761181