DocumentCode
2476954
Title
Bit error rate measurement system for RF integrated circuits
Author
Hsiao, Hsu-Feng ; Lin, Shuw-Guann ; Su, Sy-Haur ; Tu, Chih-Ho ; Chang, Da-Chiang ; Juang, Ying-Zong ; Chiou, Hwann-Kaeo
Author_Institution
Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
fYear
2012
fDate
13-16 May 2012
Firstpage
2381
Lastpage
2384
Abstract
This paper proposes a bit error rate (BER) measurement system utilizing vector signal analyzer (VSA) instrument built-in analog digital converter (ADC) and ideal digital baseband receiver of VSA software for RF integrated circuits (RFICs) such as RF amplifier, RF mixer and RF receiver. Usually, BER performance is estimated in transceiver with built-in digital baseband circuits. In the past, RF designers could not estimate RFICs effect to BER test without digital baseband circuits and vice versa for digital baseband designers. It is helpful to understand RFICs without digital baseband circuits to BER test can reduce certain risk before integrating RFICs with digital baseband circuits. Therefore, an implementation of output signal to noise ratio (SNR) calibration in a specified bandwidth and measurement method combined VSA instrument, VSA software and Advanced Design System (ADS) is used for BER measurement.
Keywords
calibration; error statistics; mixers (circuits); radio transceivers; radiofrequency amplifiers; radiofrequency integrated circuits; RF amplifier; RF integrated circuits; RF mixer; RF receiver; VSA instrument; VSA software; advanced design system; bit error rate measurement; built-in analog digital converter; built-in digital baseband circuits; calibration; digital baseband receiver; transceiver; vector signal analyzer; Baseband; Bit error rate; Instruments; Radio frequency; Receivers; Software; Software measurement; Analog digital converter; RF integrated circuits; bit error rate; digital baseband circuits; measurement; vector signal analyzer;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229204
Filename
6229204
Link To Document