A scanning-light method for inspection of tool cutting edge

Author

Shimizu, Yuki ; Jang, SungHo ; Asai, Takemi ; Ito, So ; Gao, Wei

Author_Institution

Dept. of Nanomech., Tohoku Univ., Sendai, Japan

fYear

2012

fDate

13-16 May 2012

Firstpage

2395

Lastpage

2397

Abstract

In this paper, a scanning-light method is proposed to evaluate the form of the tool cutting edge in a wide range up to several millimeters. An optical system, which consists of a photo diode, a laser diode unit and an objective lens, was developed. A small laser spot generated by the objective lens scans across the tool cutting edge, while monitoring the intensity of the laser beam passed through the tool cutting edge. In the proposed method, variation of the detected intensity is converted into information of the measured tool form. Feasibility of the proposed method was confirmed by simulations and experiments.

Keywords

cutting tools; inspection; laser beam cutting; lenses; photodiodes; semiconductor lasers; intensity detection; laser beam intensity; laser diode unit; objective lens; optical system; photo diode; scanning-light method; tool cutting edge inspection; Diamond-like carbon; Image edge detection; Laser beam cutting; Laser beams; Measurement by laser beam; Measurement uncertainty; Semiconductor lasers; cutting tool; focused laser beam; measurement; micro-object; optical sensor; positioning;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International

Conference_Location

Graz

ISSN

1091-5281

Print_ISBN

978-1-4577-1773-4

Type

conf

DOI

10.1109/I2MTC.2012.6229215

Filename

6229215