Title :
An international intercomparison of quantum-based AC Voltage Standards
Author :
Lipe, Thomas E. ; Kinard, Joseph R. ; Tang, Yi-hua ; Filipski, Piotr S.
Author_Institution :
Quantum Meas. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
We report the results of a comparison of quantum-based AC Josephson Voltage Standards (ACJVS) between the National Institute of Standards and Technology (NIST), and the National Research Council, Canada (NRC), using a thermal transfer standard as the traveling standard. Excellent agreement was obtained between NIST and NRC from measurements on the lowest voltage ranges of the thermal transfer standard, indicating that the two ACJVS systems are consistent. This work confirms that the use of the ACJVS as a reference for ac voltage measurements is viable, and these systems can form the basis for ac voltage metrology in the future. This intercomparison was performed as part of SIM Bilateral Comparison SIM.EM-S11, AC-DC Voltage Transfer Difference at Low Voltages using an AC Josephson Voltage Standard.
Keywords :
Josephson effect; electric current measurement; voltage measurement; AC voltage measurements; AC voltage metrology; AC-DC voltage transfer; ACJVS; Canada; NIST; NRC; SIM bilateral comparison SIM.EM-S11; current metrology; international intercomparison; national research council; quantum-based AC Josephson voltage standards; thermal transfer standard; Arrays; Calibration; NIST; Power transmission lines; Uncertainty; Voltage measurement; AC-DC Difference; Interlaboratory Comparison; Josephson Voltage Standard; Voltage Measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
Print_ISBN :
978-1-4577-1773-4
DOI :
10.1109/I2MTC.2012.6229229