Title :
InP HBT ring oscillator with 2.0 ps/stage gate delay
Author :
Srivastava, N.K. ; Raghavan, G. ; Thiagarajah, R. ; Case, M.G. ; Arnold, E. ; Pobanz, C.W. ; Nielsen, S.O. ; Yen, J.C. ; Johnson, R.A.
Author_Institution :
Inphi Corp., Westlake Village, CA, USA
Abstract :
We have demonstrated a record gate delay of 2 ps/stage in a 17-stage ring oscillator fabricated in a 170 GHz f/sub t/, 150 GHz f/sub max/ InP HBT technology. Stable operation was achieved for both normal and higher order ring modes. We performed basic circuit time constant analysis as well as detailed computer simulations, and arrived at calculated gate delays which are in agreement with our experimental results. The approach of using stage delay from a ring oscillator as a technology speed metric can be misleading. Such an approach would predict 250 GHz circuits in this process - which is not feasible. Real circuits require fanout of two or more which can substantially increase gate delay. In our circuit, we focused on broad-banding each individual stage and reducing interconnect parasitics to achieve the above result.
Keywords :
III-V semiconductors; MMIC oscillators; bipolar MMIC; circuit simulation; circuit stability; delay circuits; heterojunction bipolar transistors; indium compounds; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; 150 GHz; 170 GHz; 2 ps; InP HBT ring oscillators; InP-InGaAs; circuit fanout; circuit time constant analysis; individual stage broad-banding; interconnect parasitics reduction; microwave oscillators; normal/higher order ring mode stability; oscillator stage gate delay; Delay; Germanium silicon alloys; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Integrated circuit interconnections; Logic devices; Optical fiber communication; Ring oscillators; Silicon germanium;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2002. 24th Annual Technical Digest
Conference_Location :
Monterey, California, USA
Print_ISBN :
0-7803-7447-9
DOI :
10.1109/GAAS.2002.1049054