Title :
A comprehensive model for semiconductor lasers actively modelocked with frequency limiting elements and picosecond pulse compression
Author :
Zheng, Liu ; Carter, Gary M. ; Menyuk, Curtis R.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., Baltimore, MD, USA
Abstract :
Short pulses with a nearly transform limited time-bandwidth product play important roles in communications and photonics. Actively modelocking a semiconductor laser in an external cavity with frequency limiting mechanisms combined with pulse compression provides a convenient way to generate such pulses at high repetition rates. To understand the physics of this process and therefore provide guidance to future experiments and better laser design, we have developed a theoretical model to simulate the traveling wave electric fields in these lasers. Our work differs from previous results in that it includes all of the important physical effects: frequency chirp, pulse compression, strong active current modulation, frequency filtering, spontaneous emission noise, gain compression, and dynamic cavity detuning
Keywords :
high-speed optical techniques; laser cavity resonators; laser mode locking; laser noise; laser theory; optical design techniques; optical modulation; optical pulse compression; semiconductor device models; semiconductor device noise; semiconductor lasers; actively modelocked; communications; comprehensive model; dynamic cavity detuning; frequency chirp; frequency filtering; frequency limiting elements; gain compression; laser design; nearly transform limited time-bandwidth product; photonics; physical effects; picosecond pulse compression; pulse compression; semiconductor lasers; spontaneous emission noise; strong active current modulation; traveling wave electric fields; Frequency; Laser modes; Laser noise; Laser theory; Optical pulse generation; Photonics; Physics; Pulse compression methods; Pulse modulation; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
DOI :
10.1109/LEOS.1993.379048